IOM Headquarters
Post doctoral fellow

Piu Rajak’s area of research focuses on the characterization of materials at the nanoscale using HRTEM, HAADF, STEM and SEM. She has also experience in the investigation of the chemical composition of materials using energy-dispersive X-ray (EDXS). Her particular interest is in oxide thin film or heterostructure materials and nanoparticles. She uses high resolution S/TEM image simulation and reconstruction, as well as first-principles calculations based on DFT, to quantitatively determine atomic structure.