IOM Headquarters
Post doctoral fellow

Marcello Ferrara’s area of research focuses on the characterization of materials at the nanoscale using HRTEM, HAADF-STEM and SEM. He has experience in the investigation of the chemical composition of oxide thin films and nanoparticles using electron diffraction and energy-dispersive X-ray (EDXS). He has also extensive experience in nanoparticle synthesis and characterization for electrocatalytic applications.