IOM Headquarters
Post doctoral fellow

Pritam Banerjee's research area involves the atomic-scale characterization of nanostructured materials using aberration-corrected scanning transmission electron microscopy imaging (AC-S/TEM) and holography and spectroscopy. He implements various microscopy techniques such as electron holography, geometric phase analysis, STEM imaging, EDX spectroscopy, electron diffraction, and tomography to investigate the interface of oxide thin films. He has also experience in HRTEM image simulation, SEM, and X-ray diffraction.